Browse Prior Art Database

Enhanced Cmos Fault Coverage Using Existing Lssd Fault Simulators

IP.com Disclosure Number: IPCOM000065858D
Original Publication Date: 1985-Oct-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
LeBlanc, J Storey, T [+details]

Abstract

CMOS and other technologies which deploy two or more active devices in series between the supply voltage and ground are susceptible to failures commonly known as "Stuck-at-Open". The defect creates a condition in which an internal node is isolated from both supply and ground and is thus in the high impedance state.