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Enhanced Cmos Fault Coverage Using Existing Lssd Fault Simulators Disclosure Number: IPCOM000065858D
Original Publication Date: 1985-Oct-01
Included in the Prior Art Database: 2005-Feb-19

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Related People

LeBlanc, J Storey, T [+details]


CMOS and other technologies which deploy two or more active devices in series between the supply voltage and ground are susceptible to failures commonly known as "Stuck-at-Open". The defect creates a condition in which an internal node is isolated from both supply and ground and is thus in the high impedance state.