Browse Prior Art Database

Environmental Substitution Functional Testing

IP.com Disclosure Number: IPCOM000065860D
Original Publication Date: 1985-Oct-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Kane, PH Wickus, SD [+details]

Abstract

A system component is tested functionally for failures with stress conditions by isolation of the error in failure analysis and provision for feedback to improve product quality. The device under test (DUT) could be a file, card assembly, board assembly or other logical device. Any functional block in a known good system can be substituted with a DUT by bringing channels or busses to a fixture. Thus, with fixture adaptations, one tester could test cards, board assemblies, files, terminals or any other logical device in a system. The test sequence includes: 1.Surrounding the DUT with a known good system hardware environment. 2.Running field system diagnostics for test, error detection and debug. 3.