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Yield by Circuit Density in Printed Circuit Cards And Boards

IP.com Disclosure Number: IPCOM000065890D
Original Publication Date: 1985-Nov-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Bebar, JA [+details]

Abstract

One of the variables in the measurement of product yield contain- ing a mixture of products is circuit density. When this variable is not taken into account, the yield figures are misleading. This is compensated for in a first pass yield tracking method that factors in circuit density to provide a more accurate measurement of yield comparison.