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Sense Signal Characterization and Test Aid For One-Device Dynamic Memory Arrays

IP.com Disclosure Number: IPCOM000066004D
Original Publication Date: 1979-Jan-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Gaworecki, JM Thoma, NG Wager, AJ [+details]

Abstract

A time consuming and costly design step in the design of one-device dynamic memory chips is determining the size of the storage capacitor and then designing a reference dummy cell capacitor size that will give proper operation once the chips are fabricated. It has been difficult in the past to characterize sense amplifier operation due to the very small capacitances and small charge levels associated with such circuits.