Browse Prior Art Database

Material For Lapping Plates

IP.com Disclosure Number: IPCOM000066028D
Original Publication Date: 1979-Jan-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Gorey, EF Schneider, CP [+details]

Abstract

The grinding of small probe tips requires bringing the tips into contact with a lapping plate. This plate may be precharged with a grinding compound or the grinding compound can be applied to the surface of the plate. The resulting finish of the tip is affected by the plate material, grinding compound used, and pressure applied. The finish must permit the tip to make good electrical contact to silicon for testing purposes. The material described below produces superior results in this respect because of its texture and hardness.