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Four-Point Probe Contact Resistance Measurement

IP.com Disclosure Number: IPCOM000066060D
Original Publication Date: 1979-Jan-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Anantha, NG Bhatia, HS Cavaliere, JR [+details]

Abstract

Contact resistance of a resistor is measured accurately without the need to measure the physical dimensions of the resistor and without resort to curve-fitting techniques by use of the four-point probe method shown in the figure.