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Test Probe Contact Grid Translator Board

IP.com Disclosure Number: IPCOM000066074D
Original Publication Date: 1979-Jan-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Renz, U [+details]

Abstract

Probes of a tester's head are usually arranged in a grid corresponding to the contact areas of a module being tested. This board provides a grid transforming function and allows testing modules with different contact grids without changing the tester's head.