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Cycle Selecting Delay Function For Dynamic Testing Disclosure Number: IPCOM000066264D
Original Publication Date: 1979-Feb-01
Included in the Prior Art Database: 2005-Feb-19

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Hutson, DJ Villante, FJ [+details]


Test systems for high speed logic require precisely timed pulses. The reason for this is that these systems must determine whether or not pulses from the logic under test arrive at specified times.