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Storage Cell Disturb Test For Harper Cell Memory

IP.com Disclosure Number: IPCOM000066289D
Original Publication Date: 1979-Feb-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Boudon, G [+details]

Abstract

A test sequence is to be used for detecting the disturb condition during the write operation in a semiconductor memory comprising Harper cells.