Browse Prior Art Database

Tester Contact Method

IP.com Disclosure Number: IPCOM000066331D
Original Publication Date: 1979-Feb-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Kappel, GD Tatak, VH [+details]

Abstract

The dual-contact concentric probe structure of Figs. 1 and 2 provides a test probe device that enables an easy check to assure that good electrical contact is made between the tester and the package or device under test. This avoids diagnosing a fault that is actually the result of poor contact between the tester and the device under test.