Reference Marks For Determining The Position of Conductive Lines In Multilayer Ceramic Substrates
Original Publication Date: 1979-Mar-01
Included in the Prior Art Database: 2005-Feb-19
This is a method to determine the positional accuracy of internal metallurgy patterns in multilayer ceramic substrates utilizing a line pattern exposed at the substrate edge. The line pattern can be used to determine the position in both the X and Y directions.