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Reference Marks For Determining The Position of Conductive Lines In Multilayer Ceramic Substrates

IP.com Disclosure Number: IPCOM000066481D
Original Publication Date: 1979-Mar-01
Included in the Prior Art Database: 2005-Feb-19

Publishing Venue

IBM

Related People

Authors:
Melvin, G Milkovich, SA Urfer, EN [+details]

Abstract

This is a method to determine the positional accuracy of internal metallurgy patterns in multilayer ceramic substrates utilizing a line pattern exposed at the substrate edge. The line pattern can be used to determine the position in both the X and Y directions.