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LSI Module Test Probe

IP.com Disclosure Number: IPCOM000066543D
Original Publication Date: 1979-Mar-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Stark, GM [+details]

Abstract

The test probe is a tool to aid in debugging logic assemblies on a test device. Rather than probe one pin at a time and record its state, the test probe allows recording of all pins on a large-scale integration LSI) module at the same time. The recording is accomplished at tester speeds. Two passes are required for the test procedure. The first pass records the patterns of the module on a good assembly. The second compares the stored good patterns against those of the suspected module on the failing assembly.