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Trace Analysis In Gases By Laser Induced Schlieren Technique

IP.com Disclosure Number: IPCOM000066575D
Original Publication Date: 1979-Mar-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Herrmann, W Pohl, DW [+details]

Abstract

Highly sensitive impurity trace detection is based on optical calorimetry using spectral coincidences between absorption lines of molecules and laser emission lines. A first laser beam is absorbed by pollutants which creates a change of the refractive index in the gas because of local heating. This change is monitored by a second laser beam with a different wavelength intersecting the first laser beam.