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Care Tests For Failures

IP.com Disclosure Number: IPCOM000066824D
Original Publication Date: 1979-Apr-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Roth, JP [+details]

Abstract

In the generation of tests for failures in computers [1] a complete definition of the Logic has always been assumed. Therefore, the tests generated may be Don't-Care Conditions whereas what is wanted is a "Care" test, i.e., one for which the output is specified by the Architecture. In the following description. the design is given by an, in general, incomplete specification and the D-algorithm denoted in [1] is modified to obtain tests from these specifications which are guaranteed to be Care Conditions.