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Imbedded Memory Test Methods

IP.com Disclosure Number: IPCOM000066920D
Original Publication Date: 1979-May-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Kelley, SD [+details]

Abstract

Read/write storage and read-only storage usually require an extensive amount of data during testing for readout and compare steps to identify memory faults. When a memory is surrounded by functional circuits on a chip, pin and cycle time limitations make full cell testing virtually impossible. However, by the addition of simple on-chip test logic, each chip can perform a self-test routine without monopolizing a dedicated piece of test equipment.