Imbedded Memory Test Methods
Original Publication Date: 1979-May-01
Included in the Prior Art Database: 2005-Feb-20
Read/write storage and read-only storage usually require an extensive amount of data during testing for readout and compare steps to identify memory faults. When a memory is surrounded by functional circuits on a chip, pin and cycle time limitations make full cell testing virtually impossible. However, by the addition of simple on-chip test logic, each chip can perform a self-test routine without monopolizing a dedicated piece of test equipment.