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Charge Coupled Device Test System

IP.com Disclosure Number: IPCOM000067117D
Original Publication Date: 1979-Jun-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Anolick, ES Camenga, R [+details]

Abstract

The figure is a block diagram of a system for testing charge-coupled devices (CCDs). It allows for firing and exercising any CCD by varying the phasing and voltage requirements, and for the coordination of the output for utilization of auxiliary sampling equipment.