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Oscillating Beam Spectrometer Disclosure Number: IPCOM000067368D
Original Publication Date: 1979-Jul-01
Included in the Prior Art Database: 2005-Feb-20

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Seki, H Swalen, JD [+details]


An oscillating beam spectrometer for investigating thin organic films by a transmission measurement is illustrated schematically in the drawing A uniform transparent substrate 10 has a portion thereof 12 coated with the organic film of interest and an uncoated portion 14 that shares a well defined border with the coated portion 12. The coated portion forms the sample area, and the uncoated portion 14 provides the reference area. A light beam from a monochrometer (not shown) passes along path 16 and is reflected from a concave mirror 18 through an optional polarizer 20 onto a galvanometer-type oscillating mirror 22. The beam is deflected by the mirror 22 to sweep sinusoidally between the sample 12 and the reference area 14.