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Depth Profiling Of Structure And/Or Composition On Thin Films By Synchrotron Radiation Disclosure Number: IPCOM000067405D
Original Publication Date: 1979-Jul-01
Included in the Prior Art Database: 2005-Feb-20

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Related People

Eastman, D Tu, KN [+details]


A method for determining the structure and/or composition of thin films as a function of depth of penetration is described.