The following operators can be used to better focus your queries.
( ) , AND, OR, NOT, W/#
? single char wildcard, not at start
* multi char wildcard, not at start
(Cat? OR feline) AND NOT dog?
Cat? W/5 behavior
(Cat? OR feline) AND traits
Cat AND charact*
This guide provides a more detailed description of the syntax that is supported along with examples.
This search box also supports the look-up of an IP.com Digital Signature (also referred to as Fingerprint); enter the 72-, 48-, or 32-character code to retrieve details of the associated file or submission.
Concept Search - What can I type?
For a concept search, you can enter phrases, sentences, or full paragraphs in English. For example, copy and paste the abstract of a patent application or paragraphs from an article.
Concept search eliminates the need for complex Boolean syntax to inform retrieval. Our Semantic Gist engine uses advanced cognitive semantic analysis to extract the meaning of data. This reduces the chances of missing valuable information, that may result from traditional keyword searching.
A method for determining the structure and/or composition of thin films as a function of depth of penetration is described.
English (United States)
This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
100% of the total text.
Page 1 of 2
Depth Profiling Of Structure And/Or Composition On Thin Films By
A method for determining the structure and/or composition of thin films as a
function of depth of penetration is described.
When a well collimated, high intensity and continuous X-ray beam 10 is
directed onto a sample 12, the X-rays will penetrate the sample for a distance x
before they are absorbed by the film. This distance x is a function of the
composition of the sample and wavelength of X-ray employed.
The distance x and the incidence angle delta of the beam 10 will determine
the depth t of the sample 12 which is penetrated by the X-rays. Any diffraction or
florescence phenomena caused by the beam will be the result of interactions with
the material in the thickness t of the sample penetrated.
As the angle delta is increased, the depth of the sample penetrated by the X-
rays is increased, and this allows sampling over an increased thickness.
By noting the change in the characteristic output diffraction or florescent
spectra, it is possible to determine changes in the structure or composition of the
sample as a function of depth. Diffraction spectra yield structure information.
Fluorescent spectra yield composition information. It is noted that "white"
unfiltered X-ray radiation from an electron synchrotron or storage ring which can
be well collimated is an attractive source for practicing this method.
Page 2 of 2
[This page contains 1 picture or other non-text object]...