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Implementation Of I/O Contact Testing On NLT Logic Testers Disclosure Number: IPCOM000067637D
Original Publication Date: 1979-Sep-01
Included in the Prior Art Database: 2005-Feb-20

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Newsom, TH [+details]


The circuits described separate real logic failures from those caused by lack of contact without using a complex switching matrix or additional measuring circuits. This reduces the cost of testing due to debug time for a false logic error without a significant increase in hardware cost.