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Improvement Of The Quality And Uniformity Of Small-Area Josephson Junctions Disclosure Number: IPCOM000067744D
Original Publication Date: 1979-Sep-01
Included in the Prior Art Database: 2005-Feb-20

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Daetwyler, K Mohr, TO Rieder, KH Walter, W [+details]


Impurities present at the surface of niobium films are driven into the bulk film during the cleaning procedure when cleaning is done by high energy ion bombardment (argon ions of 3 kV).