Array Chip Identification
Original Publication Date: 1979-Oct-01
Included in the Prior Art Database: 2005-Feb-20
With the advent of array devices which can be sorted into subclasses based on testing, it is difficult to uniquely identify the chip with a man/machine readable part number until after final chip test. This is also after all process steps have been completed. This technique presents a means which solves this problem and potentially eliminates the need for chip testing (wafer testing being sufficient).