Testing System For Manufactured Circuit Cards
Original Publication Date: 1979-Nov-01
Included in the Prior Art Database: 2005-Feb-20
When manufacturing electronic circuit cards which contain both logic circuits and memory elements, unique problems in card testing occur. In the past, both the memory portion and the logic portion had to be isolated from one another during the test with the result that two separate tests had to be performed. The figure shows a method of integrating the testing of the logic circuits and the memory elements with a single tester to thereby reduce the time required to perform the test of the manufactured card.