Memory Swapping Universal Test Panel
Original Publication Date: 1979-Nov-01
Included in the Prior Art Database: 2005-Feb-20
An arrangement is disclosed for temporarily substituting an interface memory module of a test panel control system for a universal test panel for microprogramming systems. The need for uniquely designing a test panel for each microprocessing system is overcome by functionally and electrically swapping or interchanging a memory module of the processor with a memory module of the test panel during the testing procedure.