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Method Of Characterizing A Hall Probe Sensor

IP.com Disclosure Number: IPCOM000068035D
Original Publication Date: 1979-Nov-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Katyl, RH Zang, RA [+details]

Abstract

Hall probe 10 measures magnetic field strengths. It consists of semiconductor Hall cell crystal or sensor 11 mounted within a probe housing 12. As such, the exact locations of crystal 11 in housing 12 and the electrically active area of crystal 11, which correlates its spatial resolution, are not readily discernible. The present method derives these locations, determines the electrically active area, and determines spatial resolution.