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Detection Of Shorting Defects By Resistance Measurement

IP.com Disclosure Number: IPCOM000068123D
Original Publication Date: 1979-Nov-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Voge, JB [+details]

Abstract

This pattern is effective for testing semiconductor material for quality in the production of magnetic bubble devices, transistor circuitry, and the like.