The following operators can be used to better focus your queries.
( ) , AND, OR, NOT, W/#
? single char wildcard, not at start
* multi char wildcard, not at start
(Cat? OR feline) AND NOT dog?
Cat? W/5 behavior
(Cat? OR feline) AND traits
Cat AND charact*
This guide provides a more detailed description of the syntax that is supported along with examples.
This search box also supports the look-up of an IP.com Digital Signature (also referred to as Fingerprint); enter the 72-, 48-, or 32-character code to retrieve details of the associated file or submission.
Concept Search - What can I type?
For a concept search, you can enter phrases, sentences, or full paragraphs in English. For example, copy and paste the abstract of a patent application or paragraphs from an article.
Concept search eliminates the need for complex Boolean syntax to inform retrieval. Our Semantic Gist engine uses advanced cognitive semantic analysis to extract the meaning of data. This reduces the chances of missing valuable information, that may result from traditional keyword searching.
One of the primary ingredients in assuring a high quality level of LSI and VLSI product is its testability. To what degree could a product be tested before being qualified as a "good" product?
English (United States)
This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately
54% of the total text.
Page 1 of 2
MCM Chip/Module Testability Derivation Program
One of the primary ingredients in assuring a high quality level of LSI and
VLSI product is its testability. To what degree could a product be tested before
being qualified as a "good" product?
Currently, there are two popular modes of MCM (Multi-Chip Module) testing.
Chip-in-place-test (CIPT) involves testing each chip individually by probing.
Through-the-pins-test (TTPT) involves plugging the MCM into a socket and
testing through the MCM signal I/O. With CIPT, the testability of each chip can
be determined; however, module testability is unknown. With TTPT, the overall
module testability is known; however, individual chip testability is unknown.
The "MCM CHIP/MODULE TESTABILITY DERIVATION PROGRAM" or
cutcover was developed for use in a TTPT environment. The purpose of
cutcover is to provide not only the overall MCM testability, but also to derive the
testability of each chip mounted upon the module.
Cutcover assumes that the test generation was done using Incremental Test
Generation (ITG) or a similar technique. This form of test generation provides a
fault list in which each fault contains information indicating to which chip the fault
pertains. This price of data is called a "cut" number. The drawing shows an
MCM with cut numbers assigned to the various MCM units. Cutcover also uses
a cut cross-reference file which provides a relationship between a cut number
and chip/module part number. With the cut cross-reference file and cut-oriented
fault list the cutcover program can derive a per chip testabi...