Browse Prior Art Database

MCM Chip/Module Testability Derivation Program Disclosure Number: IPCOM000068264D
Original Publication Date: 1979-Dec-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue


Related People

Peters, RM [+details]


One of the primary ingredients in assuring a high quality level of LSI and VLSI product is its testability. To what degree could a product be tested before being qualified as a "good" product?