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MCM Chip/Module Testability Derivation Program

IP.com Disclosure Number: IPCOM000068264D
Original Publication Date: 1979-Dec-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Peters, RM [+details]

Abstract

One of the primary ingredients in assuring a high quality level of LSI and VLSI product is its testability. To what degree could a product be tested before being qualified as a "good" product?