Browse Prior Art Database

Memory Test System

IP.com Disclosure Number: IPCOM000068298D
Original Publication Date: 1979-Dec-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Anolick, ES Camenga, R Chen, L [+details]

Abstract

The memory test system shown is particularly well suited to testing charge-coupled device (CCD) memories.