Generalized Data Entry System for Creating, Storing and Cataloguing Test Data Specification
Original Publication Date: 1978-Jan-01
Included in the Prior Art Database: 2005-Feb-20
The proliferation of large-scale integration (LSI) technologies and master slices has taxed present systems that handle and store test environment data of wafers and modules. Presently, force and measure conditions are catalogued on separate files, one for each technology, master slice and tester. Tester guardbands are then calculated to adjust each set of conditions. Storing this data for further use by other programs is achieved by laboriously entering it on cards, with a new technology library for each master slice and tester. The constant need for updates coupled with the repeated creation of new files has finally made the handling of data unmanageable.