Test Latch for Memory Timing Control
Original Publication Date: 1978-Jan-01
Included in the Prior Art Database: 2005-Feb-20
The figure illustrates a memory 3 using a request-response type interface with a number of memory users 4 (one of which is shown), implemented in field-effect transistor (FET) circuitry, and a bipolar memory controller 5. Due to substantial variations in the performance of the FET memory user, it is normally necessary to develop an elaborate clocked circuit to insure that the using device had latched-up the requested data before relinquishing control of the memory.