Browse Prior Art Database

Method of Characterizing Chemicals

IP.com Disclosure Number: IPCOM000068701D
Original Publication Date: 1978-Feb-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Pak, MS Verkuil, RL [+details]

Abstract

Current investigative tools, such as SEM (Scanning Electron Microscope) and plasma chromatography, have two main drawbacks for the production line: long turnaround time and special sample preparation. The former can be partially alleviated administratively. The latter, however, is a technological problem in that during sample preparation, the evidence is often removed and permanently destroyed. In addition, the current tools are rarely able to follow (monitor) consecutive process steps. Such capability is essential to understand chemical, thermal or mechanical interactions which are the essence of any manufacturing process. Moreover, many tools permanently damage the sample in a manner making it unfit to process further for the ideal 1:1 correlation, i.e., it is nonreusable for further testing.