Browse Prior Art Database

Ion Beam Instrumentation Simulator System

IP.com Disclosure Number: IPCOM000068919D
Original Publication Date: 1978-Mar-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Benner, R Blohm, DS Hicks, WW Keller, JH Miner, M Puzak, TR Schmidt, S Smith, M Winnard, JR [+details]

Abstract

The Ion Beam Instrumentation Simulator (IBIS) System provides the analyst with an interactive computer aid for controlling either component analysis of the various stages of an ion beam system, or a simulation run of the entire ion beam system. The IBIS Systems controls the interfaces between components when two or more application programs used to model successive stages of an ion beam system are executed. At present, under the IBIS system framework, the following components or system may be executed. a. EXTRACT Program - This program models the ion beam flow from the plasma source through the extraction region. b. TRANSPORT Program - This program models the beam flow through a magnet separator. c. RAYTRACE Program - This program models the beam flow through a magnet separator with high order fitting. d.