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Preferred Crystal Orientation in Cubic Metals for Josephson Device Electrodes

IP.com Disclosure Number: IPCOM000069041D
Original Publication Date: 1978-Mar-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Murakami, M [+details]

Abstract

One cause for failure of Josephson tunneling devices during thermal cycling is strain-relaxation of the electrodes. Experimental measurement on polycrystalline Pb films containing grains of several orientations indicate that grains of different orientations display different amounts of strain. Furthermore, the measurements indicate that (100) grains are more strained than are grains with other orientations. It should therefore be possible to reduce device failure by fabricating its electrodes from a film with perfect (100) fiber structure or from a single crystal film.