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Assembly Tool for Test Probes

IP.com Disclosure Number: IPCOM000069126D
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Byrnes, HP Wahl, R [+details]

Abstract

Many test probes are comprised of a multitude of miniature electrical contacts mounted on very close centers. Because of these close centers and the configuration of the contacts, a means of progressively locating and separating contacts must be provided during assembly. The illustration shows a tool for facilitated assembly of these probes.