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Single Segment Double Kerf Approach for Semiconductor Test Chips

IP.com Disclosure Number: IPCOM000069136D
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
O'Reilly, FJ Perlman, DJ Satya, AV [+details]

Abstract

This is a dual KERF configuration which does not require a second segment generation in mask fabrication.