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Dual Use of Logic for Normal Operation and Off Line Diagnostic Testing

IP.com Disclosure Number: IPCOM000069184D
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20

Publishing Venue

IBM

Related People

Authors:
Dyche, MP Mersel, DR Nemecek, WF Stilwell, SO Stockwell, DA [+details]

Abstract

Most of the logic in the illustrated keyboard/CRT display apparatus can be tested off line by using existing hardware and data paths for both normal (on-line) operation, and off-line diagnostic testing. This is accomplished with the addition of a minimal amount of control logic and an on-line/off-line switch.