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Microprocessor Card Test Disclosure Number: IPCOM000069243D
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20

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Beaven, PA Monro, ID [+details]


Stuck fault models are not usually a practical base for the on-card testing of microprocessors. The system described here is an alternative functional test system for testing cards containing microprocessors, memory, and the attendant adapter chips. This system can either provide a go/nogo decision regarding the condition of the card, or diagnostic information for isolating faults down to module level.