Microprocessor Card Test
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20
Stuck fault models are not usually a practical base for the on-card testing of microprocessors. The system described here is an alternative functional test system for testing cards containing microprocessors, memory, and the attendant adapter chips. This system can either provide a go/nogo decision regarding the condition of the card, or diagnostic information for isolating faults down to module level.