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DC Testing of AC Powered Logic Disclosure Number: IPCOM000069273D
Original Publication Date: 1978-Apr-01
Included in the Prior Art Database: 2005-Feb-20

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Herrell, DJ Wang, CP [+details]


In integrated circuit arrangements which incorporate Josephson junction logic circuits which are powered by the application of clipped sinusoidal currents, DC testing presents a problem because the transformers become very inefficient as the frequency is reduced.