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Level Sensitive Scan Design Test Generation in Presence of certain Design Rule Violations

IP.com Disclosure Number: IPCOM000069732D
Original Publication Date: 1978-Jun-01
Included in the Prior Art Database: 2005-Feb-21

Publishing Venue

IBM

Related People

Authors:
Goel, P [+details]

Abstract

When the design rule violations occur, direct usage of LSSD (level sensitive scan design) test generators will give unsatisfactory results. Using different sets of line holds in each test generation pass (over a number of passes), it may be possible to test the entire network. The line holds in each pass effectively partition (logically) the network such that in some partitions the design rules are satisfied. By suitably selecting the line holds for different passes, it may be possible to ensure that each single stuck fault can be tested in some pass, during which the fault lies in a partition, that does not violate any design rules.