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Automatic Test Circuit for Semiconductor Devices

IP.com Disclosure Number: IPCOM000069769D
Original Publication Date: 1978-Jun-01
Included in the Prior Art Database: 2005-Feb-21

Publishing Venue

IBM

Related People

Authors:
Perner, F [+details]

Abstract

Characterization of semiconductor devices for process monitoring and quality control frequently requires the rapid measurement of complex device parameters by data acquisition systems. Measurement of transconductance of bipolar and FET devices and threshold voltage of FET devices requires a test system to simultaneously apply two independent bias conditions to the device under test to yield an output voltage.