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Generation of Final Test Patterns and Diagnostic Data for Programmable Logic Arrays

IP.com Disclosure Number: IPCOM000069945D
Original Publication Date: 1978-Jul-01
Included in the Prior Art Database: 2005-Feb-21

Publishing Venue

IBM

Related People

Authors:
Eichelberger, EB Lindbloom, E [+details]

Abstract

Described is a procedure for obtaining test patterns for programmable logic arrays (PLAs).