Diagnosing Single Faults in Fanout Free Combinational Circuits
Original Publication Date: 1978-Aug-01
Included in the Prior Art Database: 2005-Feb-21
A method is shown for constructing, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in  of n + g (g is the number of primary input gates) test and the upper bound in  of 2n for the least number of tests required to distinguish among nonequivalent single faults.