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Diagnosing Single Faults in Fanout Free Combinational Circuits

IP.com Disclosure Number: IPCOM000070285D
Original Publication Date: 1978-Aug-01
Included in the Prior Art Database: 2005-Feb-21

Publishing Venue

IBM

Related People

Authors:
Markowsky, G [+details]

Abstract

A method is shown for constructing, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in [1] of n + g (g is the number of primary input gates) test and the upper bound in [3] of 2n for the least number of tests required to distinguish among nonequivalent single faults.