Browse Prior Art Database

Exposure/Inspection Interface Utilizing Indexed Sequential Access Method On a PC Local Area Network

IP.com Disclosure Number: IPCOM000101010D
Original Publication Date: 1990-Jun-01
Included in the Prior Art Database: 2005-Mar-16
Document File: 1 page(s) / 36K

Publishing Venue

IBM

Related People

Authors:
Asbury, GS [+details]

Abstract

This article describes a system that eliminates the necessity for manufacturing operators to fill out logsheets containing critical test exposure data. Through the use of Indexed Sequential Access Method (ISAM) files, test wafer inspection priority, based on a first-in, first- out scheme, is maintained.