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# Test Data Generation Algorithm for Checking Functional Errors Caused by Input Interferences

IP.com Disclosure Number: IPCOM000101942D
Original Publication Date: 1990-Sep-01
Included in the Prior Art Database: 2005-Mar-17
Document File: 2 page(s) / 47K

IBM

## Related People

Ohba, M: AUTHOR [+1]

## Abstract

An algorithm for generating a minimal set of testcases that detects functional errors invoked only by interferences of two input variables of a system is described. Generally, it is required to test the functionality of a system with n (bit) input variables to generate 2 to the n input patterns for checking all the possible combinations of input patterns. The invention reduces the number of test patterns to < 3 log n > + 1 by focusing on the errors invoked by any combinations of two input variables.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 63% of the total text.

Test Data Generation Algorithm for Checking Functional Errors Caused by Input Interferences

An algorithm for generating a minimal set of testcases
that detects functional errors invoked only by interferences of two
input variables of a system is described.  Generally, it is required
to test the functionality of a system with n (bit) input variables to
generate 2 to the n input patterns for checking all the possible
combinations of input patterns.  The invention reduces the number of
test patterns to < 3 log n > + 1 by focusing on the errors
invoked by any combinations of two input variables.

Existing solutions:  It has been known that the two fractional
factorial method used for design of experiment can reduce the number
of test patterns.  By the method, it is sufficient to generate less
than or equal to 2n testcases (or test patterns) and more than n
testcases.  It was shown in (*) that n+1 testcases are sufficient for
checking the errors incurred by any combinations of two input
variables.

Purpose of invention:  To detect functional and design errors
hidden in software or hardware (logic) with the minimal number of
testcases.

Structure of invention:  Generate the following matrix. In the
matrix, each row corresponds to a testcase, and each column
corresponds to an input.

Each element corresponds to a value of data, that is, 1 means
on and 0 means off.

(Ima...