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Screening Method for Selection of GaAs-based Semiconductors Disclosure Number: IPCOM000104175D
Original Publication Date: 1993-Mar-01
Included in the Prior Art Database: 2005-Mar-18
Document File: 2 page(s) / 47K

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Forster, T Jakubowicz, A Oosenbrug, A [+details]


Reliable long-term performance of laser diodes requires device selection or screening to eliminate those with high probability for early failing. The reliability of GaAs-based laser diodes is strongly related to the long-term stability of their mirrors.