Browse Prior Art Database

Mosfet with Localized Channel and Punch-Through Implants to Reduce Source/Drain Junction Capacitance

IP.com Disclosure Number: IPCOM000114001D
Original Publication Date: 1994-Oct-01
Included in the Prior Art Database: 2005-Mar-27
Document File: 4 page(s) / 169K

Publishing Venue

IBM

Related People

Authors:
Bindal, A [+details]

Abstract

A MOSFET structure with localized channel implant is discussed. The intent behind this structure is to reduce the Source/Drain (S/D) junction capacitance to a minimum value so that the delay of the circuits containing such transistors can be improved with respect to the ones with conventional transistors.