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Disclosed is a method to test a number of memory product cards simultaneously using, for example, a MD407 Memory Tester. This drastically reduces the number of Testers required.
English (United States)
This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately
79% of the total text.
N-UP Test Adapter
a method to test a number of memory product cards
simultaneously using, for example, a MD407 Memory Tester. This
drastically reduces the number of Testers required.
reference to the drawing, the N-UP Test Adapter is made
up of two main components; the common section that contains the Test
Adapter Control Circuits and the Product Interface Cards that
directly interface with the product card under test. The term N-UP
refers to the capability to test a number of product cards at once (N
can be from 1 to 32). For every product card to be tested there is
a corresponding Product Interface Card.
Circuits include circuits to handle address and
data coming from the Tester, as well as control, timing and clock
circuits. Special functions that the
Tester does not provide, such
as pseudo random address and data generators, are also included in
the Control Circuits.
when only one product card is tested, signals that
come from the product card need to be checked and are fed back to the
Tester where they are compared with what was expected and an error
condition is generated when a mismatch occurs.
When testing a number
of product cards at the same time, this is difficult to do, if not
impossible. Instead, comparison is done
on the individual Product
Interface Cards and error information is stored in memories that are
on these individual Product Interface Cards.
When a te...