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N-UP Test Adapter Disclosure Number: IPCOM000117950D
Original Publication Date: 1996-Jul-01
Included in the Prior Art Database: 2005-Mar-31

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Eigner, JM Fleurbaaij, JM [+details]


Disclosed is a method to test a number of memory product cards simultaneously using, for example, a MD407 Memory Tester. This drastically reduces the number of Testers required.