Browse Prior Art Database

N-UP Test Adapter

IP.com Disclosure Number: IPCOM000117950D
Original Publication Date: 1996-Jul-01
Included in the Prior Art Database: 2005-Mar-31

Publishing Venue

IBM

Related People

Authors:
Eigner, JM Fleurbaaij, JM [+details]

Abstract

Disclosed is a method to test a number of memory product cards simultaneously using, for example, a MD407 Memory Tester. This drastically reduces the number of Testers required.