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Over-Erase Screen Method Disclosure Number: IPCOM000123144D
Original Publication Date: 1998-Jun-01
Included in the Prior Art Database: 2005-Apr-04

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Related People

Ichinose, M Sunaga, T


Disclosed is a test method of flash memory chips to sort out bad ones that will be over-erased and do not function after repetition of program and erase operations. Once over-erase occurs in erase operation, chips do not function correctly in program or erase verifications or read operation. Generally, it is impossible to predict when it will occur. The test method can detect this kind of chip easily in wafer test.