IEEE Computer Volume 12 Number 1 -- BOOK REVIEWS
Original Publication Date: 1979-Jan-01
Included in the Prior Art Database: 2005-Nov-10
Software Patent Institute
Dr. Francis P. Mathur: AUTHOR [+2]
BOOK REVIEWS * B79-1 Diagnosis and Reliable Design of Digital Systems - - M. A. Breuer and A. D. Friedman, (Woodland Hills, Calif.: Computer Science Press, Inc., 1976, 308 pp., $19.95)
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This record contains textual material that is copyright ©; 1979 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Contact the IEEE Computer Society http://www.computer.org/ (714-821-8380) for copies of the complete work that was the source of this textual material and for all use beyond that as a record from the SPI Database.
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Dr. Francis P. Mathur
Professor and Computer Science Coordinator Mathematics Department California State Polytechnic University 3801 WestTempleAvenue Pomona, CA 91768 Telephone: /714) 598~4421
(Note: publications reviewed in this section are not available from the IEEE Computer Society. Please order directly from the publisher.)
B79-1 Diagnosis and Reliable Design of Digital Systems - - M. A. Breuer and A. D. Friedman, (Woodland Hills, Calif.: Computer Science Press, Inc., 1976, 308 pp., $19.95)
Research in fault-tolerant computing has developed fully over the past decade, but most of the work has been published only in the various journals. As a result suitable reference books for a fault-tolerant curriculum have not been available, and rapid advances in digital technology have outdated the few textbooks! 2 that did appear in the early 70's.
In this book, Breuer and Friedman bring together some recent concepts in fault-tolerant computing. They attempt to encompass the entire area of fault diagnosis and reliable design of digital systems. As is customary, diagnosis of combinational and sequential circuits are treated in different chapters, the latter more elaborately. The authors discuss in detail only methods that are of some practical significance, refraining from detailed coverage of the scores of techniques (some of pedagogic interest) developed for diagnosing combinational circuits. In addition to the classical fault models (e.g., stuck-at faults), other type of faults more prevalent in ICs (e.g., a bridging fault) are included.
Besides synchronous sequential circuit testing, the book reflects the importance of asynchronous circuit testing by its concise and detailed coverage. It also recognizes an aspect overlooked in earlier texts, semiconductor memory testing, by including some of the practical testing methods (e.g., GALPAT, Walking 1's and 0's), though not in detail.
This book devotes an entire chapter to the vital role of logic simulation in the d...