MEMS-Based Testing for Metallic Materials for Microelectronic Packaging
Publication Date: 2006-Jan-31
The IP.com Prior Art Database
Disclosed is a method that uses a MEMS-based testing methodology to examine fatigue and shock properties of metallic materials for microelectronic packaging applications. Benefits include a solution that is more cost-effective than the current state of the art, and is a faster, simpler way to evaluate fundamental material behaviors.