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Method and System for Providing Extra Test Coverage via Logic Built-in-self-test (LBIST) to Line Returns and Field Returns (LRFR)

IP.com Disclosure Number: IPCOM000197638D
Publication Date: 2010-Jul-19

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method and system for determining defects in Line returns and Field Returns (LRFR) IC chips that failed to work as expected at customer’s site.